Productbeschrijving
Technische specificatie
Operating Temperature: 0°C ~ +70°C
Non-Operating Temperature: -45°C ~ +80°C
SLC NAND Flash
IOPS:
4KB Random Read: up to 4,000
Sequential Read: up to 110MB/s
Sequential Write: up to 85MB/s
ATP benefits
• Pre-screened SLC (Single-Level-Cell) NAND flash memory
• Enhanced endurance by dynamic and static wear-leveling
• Hardware BCH ECC, corrects up to 8 bits in 512 byte data
• Supports S.M.A.R.T. (Self-Monitoring, Analysis and Reporting Technology)
• Data integrity under power cycling
• In-house environment reliability testing, customized environmental testing available
• Application specific design, product performance tuning/customization
• In-house FAE team support, "our lab is your lab"
• System Level endurance/reliability testing
• Long term supported fixed/controlled BOM
• Optional SMART monitor software available
Extra informatie



